Description
1. Product Overview
The Keysight 5517C (OPT 003, A6J) is a high-precision dual-frequency He-Ne laser head, serving as the core light source unit for laser interferometer precision displacement measurement systems. It is designed for nanometer-level positioning inspection in high-speed motion applications. OPT 003 denotes the 3mm narrow beam output configuration, while A6J is a factory high-precision calibration option. This laser head emits a stable dual-frequency laser at a wavelength of 632.991354nm. Based on the Zeeman splitting heterodyne detection principle, it delivers ultra-high-precision measurement of geometric quantities including displacement, velocity, angle and straightness. With a reference frequency difference of 2.4~3.0MHz, it supports a maximum linear measurement speed of 696mm/s. It is widely applied in semiconductor lithography, flat-panel display manufacturing, coordinate precision metrology, machine tool accuracy calibration, optical laboratory testing and other fields. It can be matched with interferometer systems such as the 5501A, 5527A and 5572A to build automated measurement platforms, and also acts as an original spare part for replacement and upgrade of legacy precision inspection equipment.
2. Hardware Structure and Composition
2.1 Dual-Frequency He-Ne Laser Resonance Emission Unit
2.2 Power Drive and Voltage Stabilization Protection Unit
2.3 Polarized Optical Path and Beam Positioning Unit
2.4 Enclosure Structure, Heat Dissipation and Mounting Unit

3. Technical Specifications
3.1 Optical and Electrical Specifications
- Laser Type: Continuous-wave Zeeman dual-frequency He-Ne laser, Class II laser product
- Nominal Vacuum Wavelength: 632.991354nm
- Wavelength Accuracy: Standard ±0.1ppm; A6J calibration option ±0.02ppm (traceable calibration to MIL-STD 45662)
- Wavelength Stability: Typical ±0.002ppm over 1 hour; typical ±0.02ppm over service life
- Reference Frequency Difference: 2.4~3.0MHz
- Beam Specification: OPT 003, beam diameter 3mm, beam height 79.5±1.0mm
- Output Power: Minimum 180μW, Maximum 1mW
- Maximum Linear Measurement Speed: 696mm/s
- Power Supply: +15V±0.3V (Max. 3.0A), -15V±0.3V (Max. 0.3A)
- Warm-up Stabilization Time: 90 minutes
3.2 Environmental Specifications
- Operating Temperature: 20℃±2℃ (recommended for high-precision metrology), allowable range 15℃~30℃; Storage & Transportation Temperature: -20℃~+60℃
- Relative Humidity: 20%~80% RH, non-condensing, free of corrosive gas and dust
- Vibration Resistance: Complies with IEC vibration and shock standards for transportation; continuous vibration and impact shall be avoided during operation
- EMC Compliance: Meets industrial EMC standards, resisting electrostatic discharge and electrical fast transient interference
3.3 Mechanical Specifications
- Mounting Method: Foot-mounted / bottom threaded flush mounting, M6 and 1/4-20 UNC mounting holes
- Net Weight: 3.4kg
- Enclosure Material: Die-cast sealed aluminum alloy
- Standard Options: OPT 003 (3mm narrow beam), A6J high-precision metrology-grade wavelength calibration
- Compatible Systems: Keysight 5501A, 5527A, 5572A laser interferometer measurement systems, VME/PC architecture precision positioning measurement and control systems
4. Product Functions and Features
A6J Traceable Calibration for Metrology Compliance and Ultra-High Precision Testing
Calibrated in compliance with military standards, it delivers significantly improved wavelength measurement accuracy with legally traceable test data. It is applicable to scenarios with strict error control requirements, including third-party accuracy verification, standard value transfer in laboratories and positioning precision inspection of high-end semiconductor equipment, with compliant calibration reports available for measurement results.Dual-Frequency Heterodyne Interferometry Enables High-Precision Dynamic Displacement Measurement at High Speed
With dual-frequency laser at a frequency difference of 2.4~3.0MHz, it supports real-time displacement acquisition for moving targets up to nearly 700mm/s. No frame loss or speed measurement distortion occurs during dynamic positioning error inspection of high-speed lithography machines and panel coating equipment, balancing nanometer-level static precision and stable high-speed dynamic measurement performance.Constant-Temperature Sealed Resonant Cavity Delivers Excellent Long-Term Continuous Operation Stability
A closed-loop temperature control loop suppresses the influence of ambient temperature drift on laser wavelength and output power, satisfying the demand for 7×24-hour non-stop on-line precision inspection on production lines. It greatly reduces the frequency of production line shutdown for optical path recalibration and improves the inspection efficiency of automated manufacturing lines.Standardized Mechanical Mounting and Backward Compatibility Simplify Equipment Retrofit and Replacement
Uniform mounting references, beam height and electrical interfaces allow direct replacement of 5517C laser heads with different beam specifications within the same series. Minor modifications to the original optical layout and power wiring are required, and system reconstruction can be rapidly completed with factory calibration data, shortening the commissioning cycle for legacy equipment upgrades.Industrial-Grade Safety Protection Adaptable to Laboratory and Cleanroom Operating Conditions
Class II laser safety rating avoids eye radiation injury under normal operation. The dustproof sealed aluminum alloy enclosure fits clean workshops in the semiconductor and display industries. Built-in multi-level electrical protection withstands minor on-site power fluctuation and electrostatic interference, ensuring long-term reliable operation of the precision optical light source.5. Applicable Working Conditions and Application Scenarios
- Laser interferometric calibration and inspection of X/Y/Z three-axis positioning accuracy, repeat positioning error and straightness for semiconductor lithography equipment and wafer packaging equipment.
- On-line calibration of dynamic displacement and speed accuracy for high-speed moving platforms in coating, cutting and handling processes of LCD and OLED panel production lines.
- Traceability calibration of length standard instruments such as coordinate measuring machines, precision machine tools and linear encoders in metrology institutes and third-party testing laboratories (the A6J calibration option meets metrology compliance requirements).
- Precision measurement of nanometer displacement, angle and pitch deviation for optical precision machining, high-precision translation stages and fiber coupling equipment.
- Spare part replacement for legacy Agilent/Keysight 5517 series laser interferometer systems and upgrade projects for compact optical measurement equipment.
