Description

NI PXLE-5186 782058-02

1. Basic Information

Model: PXIe-5186

Part Number: 782058-02

Brand: NI (National Instruments)

Supported Platform: PXI Express modular test and measurement bus platform, compatible with the full series of PXIe chassisProduct Type: Single-slot high-speed 8-bit digitizing oscilloscope module. It features 2-channel 5 GHz wideband RF acquisition, a maximum real-time sampling rate of 12.5 GS/s, and large-capacity 1 GB onboard memory. Designed for high-speed digital, RF, millimeter-wave and high-speed serial bus signal acquisition, it supports nanosecond-level multi-module synchronous triggering and continuous streaming upload of massive data streams.

Product Positioning

Model 782058-02 is the standard hardware version of the PXIe-5186, with three core capabilities: 5 GHz analog bandwidth, dual-channel synchronous acquisition, 12.5 GS/s real-time sampling, and 1 GB per-channel deep onboard memory. It can accurately capture high-frequency transient waveforms such as high-speed clock signals, high-speed serial signals, RF pulses, transient electromagnetic interference and millimeter-wave modulated signals. It supports flexible switching between two input impedances (50 Ω / 1 MΩ) and programmable AC/DC coupling configuration, and integrates more than ten advanced triggering modes including edge, pulse width, video, window and sequence triggering.

Leveraging the PXIe Gen3 high-speed bus, PXI star trigger and RTSI synchronization bus, multiple oscilloscope modules can achieve sub-10 ps high-precision timing synchronization across different cards and multiple chassis. Matched with the NI-SCOPE driver, it is compatible with development environments such as LabVIEW, TestStand, Python and C/C++. The built-in automatic self-calibration circuit can suppress gain and offset drift errors over long-term operation. Widely applied in waveform capture, signal integrity testing and transient fault waveform capture for semiconductor chips, high-speed communications, aerospace RF systems, automotive millimeter-wave radars and military electronics, it serves as a core acquisition spare part for high-frequency automated test systems.

Hardware Architecture

The module adopts a 3U single-slot reinforced heat-dissipating PXIe card structure with aluminum passive heat sinks and a built-in temperature-controlled air duct. The PCB is coated with three-proof anti-corrosion material; the RF signal links feature precise impedance matching, and all ports are equipped with hardware protection against ESD, RF surge, overvoltage and overload. It consists of six core hardware units as follows:

5 GHz Wideband RF Front-End Signal Conditioning Unit

Two independent RF signal channels are integrated, each equipped with a programmable impedance switching circuit (50 Ω RF matching / 1 MΩ general high impedance), AC/DC coupling switch, multi-stage programmable gain amplifier and hardware anti-aliasing filter. With a VSWR ≤ 1.25, it effectively suppresses high-frequency signal reflection and harmonic interference, ensures accurate amplitude and phase acquisition across the full bandwidth, and delivers a rise time as low as 170 ps.

12.5 GS/s High-Speed 8-bit ADC Sampling Unit

Two independent high-speed analog-to-digital conversion chips are deployed. The maximum real-time sampling rate reaches 12.5 GS/s for a single channel and 6.25 GS/s per channel under dual-channel synchronous mode. A hardware phase-locked loop provides synchronized sampling clock, and an external 1.6~3.125 GHz sampling clock can be connected for synchronous clocking to support high-precision multi-device synchronous acquisition with a common clock source.

1 GB Per-Channel Deep Onboard Storage Unit

Each channel is equipped with 1 GB high-speed acquisition memory, supporting segmented acquisition, sequence triggering and segmented storage of ultra-long waveforms. It can capture a single ultra-long transient waveform or store tens of thousands of pulse event waveforms in batches, addressing common testing pain points including difficulty in reproducing intermittent high-frequency fault signals and data loss.

Multi-Mode Hardware Trigger & Timing Synchronization Unit

It integrates analog channel hardware triggering, external PFI triggering and reference clock synchronization interfaces, supporting advanced trigger types such as edge, glitch, pulse width, runt, window and serial protocol triggering. Equipped with the PXIe_CLK100 backplane reference clock and 10 MHz / 100 MHz external SMB reference clock input, it achieves sub-10 ps timing synchronization across multiple modules and chassis via the RTSI bus.

Built-in High-Precision Self-Calibration Signal Source Unit

An on-board high-stability DC reference calibration source enables one-click full-channel self-calibration for gain, offset, impedance and bandwidth to automatically compensate measurement drift caused by ambient temperature variations. The factory calibration is valid for one year, which significantly reduces on-site periodic external calibration and maintenance costs and guarantees stable measurement accuracy under wide-temperature operating conditions.

PCIe Gen3 High-Speed Bus Data Transmission Unit

Compliant with the PXIe Gen3 bus specification, each slot features exclusive 8 GB/s bidirectional bandwidth. It supports hardware streaming continuous upload of waveform data, enabling real-time storage and offline playback & analysis of massive sampled data without CPU cache forwarding. Meanwhile, it uploads real-time diagnostic information regarding module hardware health, link status, clock signals and overload faults.

Mounting Specifications

Mounting Method: Embedded installation into a standard 3U single-slot PXIe chassis, compatible with the full series of PXIe chassis including PXIe-1085, supporting in-situ replacement in any slot
Form Factor: Standard 3U PXIe card size with integrated aluminum heat sinks
Front Panel Interfaces: 2 BNC analog input channels, 1 SMB external sampling clock input, 1 SMB reference clock input, multiple PFI trigger terminals, LED indicators for hardware status
Driver Software: Official NI-SCOPE driver, compatible with NI MAX, LabVIEW, TestStand, Python, C# and other development tools
Firmware Compatibility: Backward compatible with all PXIe chassis backplanes; supports Windows desktop OS and NI Linux Real-Time OS; can be synchronously networked with any NI oscilloscope or signal generator on the same platform

Supporting System

Supporting Hardware

High-performance PXIe chassis, embedded real-time controller, 50 Ω shielded RF coaxial cables, BNC/SMA adapter probes, signal generators, attenuators, impedance matching loads.

Commissioning Tools

NI MAX configuration software, RF signal generator, oscilloscope calibrator, anti-static wristband, vector network analyzer (for cable impedance calibration).

Upper-Level System Integration

Automated test host computer, offline waveform analysis software, test data management platform, realizing waveform acquisition, automatic parameter measurement, batch report generation and fault waveform storage & traceback.

Typical Application Industries

5G / high-speed serial communication signal integrity testing, semiconductor chip high-speed interface verification, automotive millimeter-wave radar RF testing, waveform acquisition for aerospace radar and navigation equipment, military EMC transient interference testing, transient waveform capture for high-speed power electronic switches.

Product Features

1. 5 GHz Ultra-Wide Bandwidth + 12.5 GS/s Real-Time Sampling for Accurate High-Frequency Signal Restoration

The dual-channel 5 GHz analog bandwidth provides full coverage under 50 Ω RF impedance. Combined with the ultra-high 12.5 GS/s real-time sampling rate, it precisely captures picosecond-level rising edges, high-frequency transient pulses and RF modulated waveforms to avoid aliasing distortion, meeting stringent testing requirements for millimeter-wave and high-speed bus applications.

2. 1 GB Large-Capacity Deep Onboard Memory for Reliable Intermittent Fault Waveform Capture

The 1 GB per-channel large memory supports multiple acquisition modes including segmented, sequence and glitch triggering. It can monitor random occasional fault waveforms for extended periods and store tens of thousands of abnormal waveform segments in one batch, solving industry testing challenges of hard-to-reproduce and hard-to-locate intermittent faults.

3. Dual-Impedance Design for Flexible Compatibility with RF and General Electrical Signals

One-click software switching is available between standard 50 Ω RF impedance (for high-frequency signal impedance matching and reflection suppression) and 1 MΩ high impedance (for conventional voltage and low-frequency sensor signals), with programmable AC/DC coupling. A single module covers both RF R&D and general electrical test scenarios to reduce hardware investment.

4. Built-In Hardware Self-Calibration Ensures Long-Term Measurement Stability Under Wide-Temperature Conditions

An on-chip high-precision reference source performs one-click full-parameter self-calibration for channel gain, offset, bandwidth and impedance to automatically compensate temperature drift from 0 ℃ to 55 ℃. With a one-year factory calibration cycle, it reduces on-site external calibration frequency and maintenance costs while ensuring consistent measurement results in mass production testing.

5. Sub-10 ps Multi-Module High-Precision Synchronization for Distributed Large-Scale Test Networking

Relying on the PXIe backplane 100 MHz reference clock, external high-precision reference clock input and RTSI real-time synchronization bus, multiple PXIe-5186 modules achieve sub-10 ps timing synchronization across slots and chassis, enabling the construction of multi-channel RF arrays and distributed synchronous waveform acquisition test systems.

6. High-Speed Hardware Streaming Data Transmission for Long-Term Lossless Continuous Acquisition

PCIe Gen3 hardware DMA streaming upload transmits massive waveform data directly to host memory, supporting uninterrupted multi-hour continuous acquisition and real-time waveform storage. It is ideal for long-duration reliability aging tests and continuous electromagnetic interference monitoring applications.

2. Technical Specifications

2.1 Core Analog Input Parameters

Number of Channels: 2 independent synchronous analog input channels
Analog Bandwidth: 5 GHz @ 50 Ω; 500 MHz @ 1 MΩ
Real-Time Sampling Rate: Max. 12.5 GS/s (single channel); 6.25 GS/s per channel (dual-channel synchronous mode)
Sampling Resolution: 8-bit ADC
Typical Rise Time: 170 ps (50 Ω bandwidth mode)
Selectable Input Impedance (Software Configurable): 50 Ω / 1 MΩ, VSWR ≤ 1.25
Coupling Mode: Programmable AC coupling / DC coupling
Full-Scale Voltage Range @ 50 Ω: 0.05 ~ 5 V peak-to-peak
Full-Scale Voltage Range @ 1 MΩ: 0.05 ~ 50 V peak-to-peak
Maximum Safe Input Voltage: 3 Vrms (50 Ω mode); 50 Vrms (1 MΩ mode)

2.2 Memory & Trigger Parameters

Onboard Memory Capacity: 1 GB deep memory per channel
Trigger Types: Edge, glitch, pulse width, runt, window, video, sequence, external hardware trigger, bus protocol trigger
Typical Trigger Jitter: < 15 ps RMS
Trigger Sensitivity: 3% of full scale
External Reference Clock: 10 MHz / 100 MHz SMB input; external sampling clock 1.6~3.125 GHz SMA input
Synchronization Methods: PXIe backplane clock, RTSI synchronization bus, phase-locked synchronization via external high-precision reference clock

2.3 Bus & Communication Parameters

Bus Standard: PXI Express Gen3, 8 GB/s unidirectional bandwidth per slot
Data Transmission Modes: Hardware DMA streaming continuous upload, segmented acquisition via single trigger
Driver Architecture: NI-SCOPE, compatible with Windows and NI Real-Time OS
Timing Synchronization Accuracy Between Multiple Modules: < 10 ps

2.4 Environmental Specifications

Operating Temperature: 0 ℃ ~ +55 ℃ (chassis air-cooled full-load condition)
Storage & Transportation Temperature: -20 ℃ ~ +70 ℃
Relative Humidity During Operation: 10% ~ 80% RH, non-condensing, free of corrosive gas and conductive dust
Vibration Compliance: IEC 60068-2-6, continuous vibration resistance of 0.3 grms within 5~500 Hz
MTBF (Mean Time Between Failures): ≥ 250,000 hours
Ingress Protection Rating: IP20, to be installed only in sealed dust-proof shielded industrial control cabinets

2.5 Mechanical & Physical Specifications

Mounting Method: Fixed installation in a 3U single-slot PXIe chassis with panel locking screws
Net Weight: Approximately 1.15 kg
Housing Structure: Reinforced shielded aluminum enclosure with integrated heat sinks; PCB coated with three-proof material
Front Panel Configuration: 2 BNC analog input ports, SMB reference clock port, SMA external sampling clock port, PFI trigger terminals, four LED status indicators for Power / Run / Trigger / Overload

3. Key Features

Precise Capture of 5 GHz Wideband High-Speed Transient WaveformsDual-channel synchronous high-frequency signal acquisition restores fast-changing waveforms including picosecond edges, RF modulation, high-speed serial buses and switching transients, supporting accurate measurement and waveform analysis for signal integrity, electromagnetic interference and radar RF parameters.

Large Deep Memory Enables Locked Capture of Intermittent Fault Waveforms

Combining 1 GB onboard memory with multiple intelligent trigger modes, the module monitors random abnormal waveforms for long durations and automatically filters and stores fault segments, resolving testing challenges caused by hard-to-reproduce intermittent electromagnetic interference and sporadic hardware failures.

Dual-Impedance and Dual-Coupling Modes Cover RF and General Electrical Testing

The 50 Ω impedance with AC coupling suppresses DC offset for RF R&D applications, while 1 MΩ high impedance with DC direct sampling is adopted for general industrial voltage and low-frequency sensor testing. One single module supports diverse test scenarios and reduces hardware investment.

One-Click Hardware Self-Calibration Ensures Stable Measurement Accuracy Under Wide Temperature

An on-chip high-precision reference source automatically calibrates full-channel gain, offset and bandwidth to eliminate temperature-induced measurement errors, eliminating frequent manual external calibration and ensuring consistent test results in mass production.

Sub-10 ps Multi-Device Synchronization Enables Distributed Test System Construction

With external high-precision clocks and the RTSI synchronization bus, multiple oscilloscopes and signal generators achieve strict timing synchronization to build multi-channel RF arrays and multi-node distributed synchronous automated test platforms.

High-Speed Streaming Data Transmission Supports Long-Term Uninterrupted Monitoring

PCIe Gen3 hardware DMA streaming upload realizes lossless real-time storage of massive waveforms, supporting round-the-clock equipment reliability aging tests, long-duration continuous electromagnetic environment monitoring and full-lifecycle fault waveform traceability analysis.

4. Working Principle

After being inserted into a powered-off PXIe chassis slot and securely fastened, the chassis supplies power via the backplane bus. The module performs power-on self-test for the RF front-end, ADC sampling, clock circuits and memory units, and the NI-SCOPE driver automatically enumerates and identifies the hardware model and channel resources.

After the host software configures parameters such as sampling rate, bandwidth, input impedance, coupling mode, trigger mode and memory length, external RF or voltage signals enter the RF conditioning link via BNC connectors. Following impedance matching, filtering and programmable gain amplification, signals are converted into digital waveforms by the 8-bit high-speed ADC under the control of a phase-locked sampling clock, and waveform data is temporarily stored in the local 1 GB deep memory. When the preset trigger condition is met, the hardware latches the current waveform segment, which can either be uploaded to the host in batches after single-shot storage or continuously streamed to the host via the high-speed PXIe bus in streaming mode.

During operation, the module monitors input overload, clock loss and link anomalies in real time, triggers corresponding LED alarms on the front panel and uploads fault information to the register. Synchronization across multiple modules is realized via an external SMB reference clock. The one-click self-calibration function invokes the internal standard voltage source to correct gain and offset errors channel by channel, ensuring stable measurement accuracy across the full operating temperature range.

5. Application Scenarios

High-Speed Communications & Semiconductor Industry: Signal integrity testing for high-speed serial buses such as PCIe, USB and Ethernet; eye diagram, jitter and rising-edge parameter acquisition and verification for chip high-speed IO interfaces.
Automotive Electronics & Millimeter-Wave Radar: Waveform acquisition for transmit and receive signals of 77 GHz automotive radars, automated testing of modulated signal parameters and pulse timing sequences.
Aerospace & Military Testing: Waveform capture for airborne radar and navigation RF equipment, transient EMC interference testing, and timing consistency verification for pulse commands.
Power & New Energy Industry: Transient voltage and current waveform acquisition for IGBT and SiC power devices; capture and analysis of overshoot, oscillation and spike fault waveforms.
Automated Test System Renovation Projects: Replacement and upgrade of legacy low-bandwidth oscilloscope modules to build high-frequency RF automated test platforms, reusing existing PXIe chassis and test programs to reduce hardware renovation costs.