Description
NI PXLE-1085 783588-01
I. Basic Information
Model: PXIe-1085
Part Number: 783588-01
Brand: National Instruments (NI)
Platform: PXI Express Modular Test & Measurement Bus PlatformProduct Type: 18-slot high-performance hybrid PXIe chassis with PCIe Gen3 high-speed backplane, total system bandwidth up to 24 GB/s. It provides stable power supply, high-speed data bus, precision clock synchronization, multi-channel trigger bus and thermal protection for PXI/PXIe modular instruments, serving as the core hardware carrier of automated test, high-speed data acquisition, RF measurement and simulation verification systems。
Product Positioning
783588-01 is the high-bandwidth version of PXIe-1085, equipped with a full hybrid high-speed backplane, including 16 general hybrid peripheral slots and 1 dedicated system timing slot, with a single-slot unidirectional bandwidth of 8 GB/s. It is compatible with PXI, PXIe, CompactPCI and CompactPCI Express 3U standard modules, built-in 10 MHz/100 MHz dual reference clocks and multi-level trigger buses to support multi-chassis cascaded high-precision synchronization. With a total power of 775 W, it can operate stably without derating at 0~55℃. Widely used in aerospace testing, automotive EOL production line, semiconductor inspection, power system simulation and multi-channel vibration measurement, it is the standard core hardware for large-scale modular test systems。
Hardware Architecture
The chassis adopts industrial reinforced steel structure and multi-layer impedance-matched high-speed backplane, with ESD and surge protection for all ports. It consists of six core units: PCIe Gen3 high-speed backplane transmission unit, precision clock & trigger synchronization unit, modular intelligent power supply unit, temperature-controlled heat dissipation & health monitoring unit, hybrid slot expansion unit, remote power control & safety protection unit. It supports hot configuration of trigger routing, remote power on/off and real-time hardware fault early warning, effectively resisting industrial electromagnetic interference and ensuring low-latency high-bandwidth data transmission between multi-modular test instrumentsdocs-be.ni.com。
Mounting & Supporting System
- Mounting: Standard 4U 19-inch rack-mounted / desktop placement, dimension: 430mm×177mm×470mm, net weight: 13.2kg
- Configuration Software: NI MAX, LabVIEW, TestStand for clock trigger configuration, system health monitoring and remote power management
- Supporting Devices: PXIe embedded controller, DAQ cards, oscilloscopes, RF instruments, shielded SMA clock cables
- Upper System Compatibility: Industrial test IPC, automated test management platform via MXIe/Ethernet
- Typical Industries: Aerospace, new energy vehicle, semiconductor, power grid, rail transit, industrial fault diagnosis test field.
Product Characteristics
- 24 GB/s total system bandwidth and 8 GB/s per-slot exclusive bandwidth realize lossless high-throughput real-time data transmission for high-speed acquisition and broadband RF test scenarios.
- Universal hybrid slots support mixed insertion of legacy PXI and new-generation PXIe modules, maximizing reuse of existing test hardware and reducing system upgrade cost.
- Dual built-in reference clocks plus multi-level trigger buses achieve nanosecond-level multi-module synchronous testing to improve test consistency and measurement accuracy.
- 775 W high-efficiency modular power supply and temperature-controlled directional air duct ensure 24/7 stable full-load operation in wide-temperature industrial environments.
- Real-time monitoring of voltage, temperature and fan speed supports local LED and remote software dual fault early warning for predictive maintenance.
- Reinforced steel casing and EMC three-level anti-interference design adapt to complex industrial on-site vibration and electromagnetic interference environments.
II. Technical Specifications
2.1 Power Supply Parameters
- AC Input: 90~264 VAC, 47~63 Hz, rated 100~240 VAC
- Rated Input Current: 6 A~12 A, total DC output power: 775 W
- Max Per-slot Power: 38.25 W, typical efficiency: 70%
- Overcurrent Protection: 15 A AC circuit breaker, voltage regulation accuracy: 3.3 V＜±0.2%, 5 V/±12 V＜±0.1%
- Dielectric Withstand Voltage: 1500 VAC 1min isolation between power/clock ports and ground.
2.2 Backplane & Bandwidth Parameters
- Bus Standard: PCI Express Gen3, total system bandwidth: 24 GB/s
- Per-slot Unidirectional Bandwidth: 8 GB/s, slot layout: 16 hybrid peripheral slots + 1 timing slot
- Compatible Modules: 3U PXI, PXIe, CompactPCI, CompactPCI Express, supports P2P point-to-point data streaming.
2.3 Clock & Trigger Parameters
- Reference Clocks: 10 MHz external I/O SMA clock, 100 MHz PXIe_SYNC100 high-speed synchronization clock
- Trigger Buses: PXI trigger bus, PXI star trigger, PXIe differential star trigger, visual trigger routing configuration via NI MAX software.
2.4 Environmental & Mechanical Parameters
- Operating Temperature: 0℃ ~ +55℃; Storage Temperature: -20℃ ~ +70℃
- Humidity: 5%~80%RH non-condensing, vibration compliant with IEC 60068-2-6
III. Key Features
- Standardized hardware bearing platform realizes flexible construction of multi-type automated test systems by combining various modular measurement instruments.
- High-bandwidth low-latency PCIe Gen3 backplane guarantees integrity and real-time performance of massive dynamic test data transmission.
- Nanosecond-level global timing synchronization supports single-chassis and multi-chassis distributed large-scale synchronous test tasks.
- Hybrid backward-compatible slot design effectively reduces hardware investment and commissioning cycle of test system technical renovation projects.
- Intelligent hardware health monitoring and remote power management realize unattended centralized operation and maintenance of automated production line test equipment.
- Wide-temperature industrial-grade design meets long-term continuous test requirements in laboratories and factory production environments.
IV. Working Principle
After AC power input, the internal modular power supply outputs multi-channel regulated DC voltage to the high-speed backplane. The chassis completes hardware self-inspection after power-on, and each PXI/PXIe module establishes a high-speed PCIe communication link with the system controller. The built-in clock and trigger bus distribute synchronous timing signals to each module according to software configuration to realize coordinated test work. The real-time monitoring unit collects operating parameters such as voltage and temperature, triggers local LED alarm and remote fault upload when abnormal conditions occur, and supports remote power control through the rear 8-pin interface to realize centralized equipment management.
V. Application Scenarios
- Aerospace & military industry: Automated comprehensive test system for airborne equipment, radar and inertial navigation components.
- New energy vehicle production line: Batch functional test of vehicle ECU, battery management system and on-board sensors.
- Semiconductor industry: Electrical and RF parameter inspection of wafer and integrated circuit chips.
- Power & rail transit industry: Relay protection simulation test and multi-channel vibration noise synchronous measurement system.
- Scientific research & technical renovation projects: Construction of multi-physics experimental test platforms and bandwidth upgrade of legacy PXI test systems.
