NI PXLE-8135 782450-04 Quad-core PXIe embedded controller

NI PXLE-8135 782450-04 Quad-core PXIe embedded controller

Brand: National Instruments

Product ID: PXLE-8135

Condition: New / used

Terms of payment: Paypal、T/T 、Western Union

Category:

Description

NI PXLE-8135 782450-04

I. Basic Information


Model: PXIe-8135

Part Number: 782450-04

Brand: National Instruments (NI)

Supported Platform: PXI Express modular test and measurement bus platform, compatible with full-series PXIe chassis such as PXIe-1085Product Type: Single-slot high-performance 3U PXIe embedded controller, powered by Intel Core i7 quad-core processor. It serves as the local main control unit of the PXIe test system, independently running test programs, massive data computing and real-time timing control, designed for high-bandwidth data streaming, complex algorithm calculation and multi-module synchronous automated test applications.


Product Positioning

Model 782450-04 is the standard configuration version of PXIe-8135, equipped with Intel Core i7-3610QE quad-core processor with a base frequency of 2.3 GHz and single-core turbo frequency up to 3.3 GHz. It is factory configured with 4 GB DDR3 1600 MHz RAM (expandable to maximum 8 GB) and a 250 GB built-in hard drive. Connected to the chassis backplane via 4 channels of PCIe Gen2 x4 links, it delivers a maximum unidirectional system bandwidth of 8 GB/s, perfectly matching high-throughput acquisition modules including high-speed oscilloscopes, broadband RF instruments and multi-channel DAQs for real-time transmission of massive streaming data.Equipped with rich peripheral ports including dual Gigabit Ethernet, six USB interfaces, dual DisplayPort video outputs, RS232 serial port and GPIB bus, it natively supports Windows desktop OS and LabVIEW Real-Time operating systems, applicable to conventional automated test tasks as well as hard real-time closed-loop control and high-precision synchronous timing applications. Widely deployed in aerospace military RF testing, automotive EOL mass production inspection, semiconductor chip verification, power system relay protection simulation and structural multi-channel vibration acquisition systems, it acts as the core main control spare part for modular PXIe test platforms.


Hardware Architecture

The module adopts a 3U single-slot industrial reinforced PXIe card structure with intelligent temperature-controlled cooling air duct and conformal coated PCB. All ports are protected by multi-level ESD, surge and noise filter circuits, consisting of six core functional units: quad-core high-performance computing unit, DDR3 high-speed memory cache unit, local mass storage unit, PCIe Gen2 high-speed backplane bus unit, multi-type peripheral expansion unit, hardware clock & system protection unit. It supports P2P point-to-point data transmission to reduce CPU load and ensures stable high-bandwidth concurrent data transmission among multiple instruments, with industrial wide-temperature components to resist temperature fluctuation and electromagnetic interference in complex factory environments.


Mounting & Supporting System

  • Mounting: 3U single-slot installation in the dedicated system controller slot of PXIe chassis, compatible with all PXIe series chassis, supporting in-situ hardware replacement
  • Front Panel Interfaces: 2×DisplayPort, 2×USB3.0, 4×USB2.0, dual Gigabit Ethernet, RS232, GPIB, reset & CMOS clear buttons, status LED indicators
  • Supporting Software: NI MAX, LabVIEW, TestStand, LabVIEW Real-Time for system deployment, hardware driver identification and remote O&M
  • Compatible OS: Windows7 32/64-bit, NI Linux Real-Time; compatible with all NI PXI/PXIe instrument modules
  • Optional Accessories: Removable front hard drive bracket, ExpressCard/34 expansion card, industrial wide-temperature upgraded memory module
  • Typical Industries: Semiconductor, new energy vehicle, aerospace defense, power grid, rail transit automated test field.


Product Characteristics

  1. Quad-core high computing performance supports high-load tasks including massive waveform analysis, batch parameter judgment and real-time closed-loop control to avoid system congestion and data loss in high-throughput test scenarios.
  2. Expandable 8 GB RAM together with local large-capacity hard drive enables long-term unattended aging test and continuous mass production inspection with reliable local data backup and one-click system mirror recovery.
  3. 8 GB/s high-bandwidth PCIe Gen2 backplane with P2P transmission greatly reduces main controller load and guarantees accurate timing and complete data for multi-module synchronous high-speed acquisition.
  4. Abundant peripheral interfaces support physical isolation of internal and external networks, local debugging and third-party equipment linkage, convenient for factory centralized data uploading and remote equipment operation and maintenance.
  5. Dual operating system compatibility covers conventional visual automated test and hard real-time deterministic timing control scenarios to maximize hardware reuse for diversified test demands.
  6. Industrial ruggedized wide-temperature design with intelligent thermal control and three-proof coating ensures stable full-load operation under harsh factory vibration and electromagnetic interference conditions.



II. Technical Specifications


2.1 Processor & Memory

  • CPU: Intel Core i7-3610QE 4-core 4-thread, base 2.3 GHz, max single-core turbo 3.3 GHz
  • Cache: 256 KB per core, total 1 MB L2 cache
  • Standard RAM: 4 GB DDR3 1600 MHz, maximum expandable to 8 GB
  • Storage: 250 GB SATA built-in hard drive, optional front removable HDD


2.2 Backplane Bus

  • Bus Type: 4×PCI Express Gen2 x4
  • Max Unidirectional System Bandwidth: 8 GB/s
  • Per-Slot Unidirectional Bandwidth: 2 GB/s, supports P2P point-to-point data transmission


2.3 Peripheral Interfaces

  • Video: 2×DisplayPort
  • USB: 2×USB3.0, 4×USB2.0
  • Network: Dual 10/100/1000 Mbps Gigabit Ethernet
  • Serial: 1×RS232, 1×parallel port
  • Instrument Bus: Onboard PCI-GPIB controller
  • Hardware Buttons: Reset switch, CMOS clear switch


2.4 Software Compatibility

  • Desktop OS: Windows7 32/64-bit
  • Real-Time OS: LabVIEW Real-Time, NI Linux Real-Time
  • Supported Development Tools: Full series of NI software and device drivers, supports remote system mirror cloning and batch deployment


2.5 Environmental Specifications

  • Standard Operating Temperature: 5℃ ~ +50℃ full load
  • Extended Temp Version: -20℃ ~ +60℃
  • Storage Temperature: -40℃ ~ +85℃
  • Humidity: 5%~80%RH non-condensing, vibration compliant with IEC 60068-2-6


2.6 Mechanical Specifications

  • Mounting: Dedicated single-slot installation for PXIe chassis with panel locking screws
  • Net Weight: 1.3 kg
  • Power Supply: 5 VDC from PXIe chassis backplane
  • Housing: Metal shielded enclosure with intelligent cooling fan, PCB conformal three-proof coating


III. Key Features


  1. Acts as the local core main controller of PXIe test system to replace external industrial computers, independently completing the whole process of automated testing including data acquisition, algorithm calculation, judgment and report generation.
  2. High-bandwidth backplane and P2P transmission realize lossless concurrent high-speed data streaming of multiple instruments to ensure precise synchronous timing for multi-channel high-frequency test tasks.
  3. Expandable memory and local mass storage support long-term unattended test and one-click system backup & recovery to reduce on-site deployment and maintenance downtime.
  4. Dual-network physical isolation and rich peripheral ports realize secure factory data uploading, local debugging and multi-device linkage control.
  5. Dual OS deployment adapts to general mass production test and microsecond-level hard real-time closed-loop measurement & control scenarios.
  6. Hardware reset and CMOS clear functions enable rapid troubleshooting of system boot failures to improve production equipment uptime.


IV. Working Principle


After power-off installation and locking in the dedicated PXIe chassis controller slot, the module completes power-on self-test of CPU, memory, storage, PCIe bus and peripheral circuits when the chassis is powered on. The operating system boots from the built-in hard drive, and NI drivers automatically enumerate all PXIe instruments and allocate bus resources. During test execution, the controller sends trigger and acquisition commands via the high-speed backplane, receives massive measured data, caches data in RAM and archives to local hard disk, meanwhile implementing algorithm processing and result judgment. Dual Ethernet realizes isolated network access for local debugging and remote data upload. The system monitors hardware temperature, fan speed and link status in real time, triggers fault indicators for abnormal conditions, and supports hardware reset and CMOS restoration to resolve system crash and boot errors rapidly.


V. Application Scenarios


  1. Semiconductor & high-speed communication industry: Main control unit for high-speed bus signal integrity automatic test platforms.
  2. New energy vehicle manufacturing: EOL function batch test main controller for vehicle ECU, BMS and automotive millimeter-wave radar.
  3. Aerospace & defense industry: Core main control of airborne equipment RF and EMC comprehensive synchronous test systems.
  4. Power & rail transit industry: Real-time simulation and multi-channel vibration data acquisition main control platform for relay protection devices.
  5. Industrial automation renovation: Upgrade legacy PXI systems with embedded local controller to optimize hardware layout and improve test timing precision.

contact us